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Volumn 30, Issue 2, 1999, Pages 135-139

STM/STS studies of tungsten clusters on Si(111) surfaces using a newly developed deposition apparatus

(2) Tanaka, Nobuo a Takeuchi, Norihito a

Author keywords

Deposition apparatus; DV X method; Reflection high energy electron diffraction (RHEED); Scanning tunneling microscopy (STM); Scanning tunneling spectra (STS); Si(111) surface; Tungsten clusters

Indexed keywords

EID: 0033057718 PISSN: 09684328 EISSN: None Source Type: Journal
DOI: 10.1016/S0968-4328(99)00016-5 Document Type: Conference Paper

Times cited : (1)

References (10)

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