Establishment of absolute diffuse reflectance scales using the NPL Reference Reflectometer

Analytica Chimica Acta

Volumn 380, Issue 2-3, 1999, Pages 165-172

  Williams, David C ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Diffuse reflectance; Radiance factor; Reflectameter

Indexed keywords

SILICON;

CONFERENCE PAPER; DIODE; INFRARED RADIATION; LIGHT; MEASUREMENT; POLARIZATION; PRIORITY JOURNAL; PRISM; REFERENCE VALUE; REFLECTOMETRY; ULTRAVIOLET RADIATION;

EID: 0033045630     PISSN: 00032670     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0003-2670(98)00480-2     Document Type: Conference Paper

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