High-accuracy measurement of specular spectral reflectance and transmittance

Analytica Chimica Acta

Volumn 380, Issue 2-3, 1999, Pages 317-325

  Haapalinna, Atte ^a   Manoochehri, Farshid ^a   Ikonen, Erkki ^a  

^a AALTO UNIVERSITY   (Finland)

Author keywords

Reflectance; Spectrometers; Standards; Transmittance

Indexed keywords

ACCURACY; CALCULATION; CONFERENCE PAPER; FILTER; GEOMETRY; INFRARED RADIATION; MEASUREMENT; PRIORITY JOURNAL; REFERENCE VALUE; REFLECTOMETRY; REFRACTION INDEX; SPECTROPHOTOMETRY; ULTRAVIOLET IRRADIATION;

EID: 0033045446     PISSN: 00032670     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0003-2670(98)00476-0     Document Type: Conference Paper

References (16)

1. Manoochehri F., Ikonen E. Appl. Opt. 34:1995;3686.
2. Kärhä P., Lassila A., Ludvigsen H., Manoochehri F., Fagerlund H., Ikonen E. Opt. Eng. 34:1995;2611.
3. F. Manoochehri, A. Haapalinna, E. Ikonen, Proceedings of the XIV IMEKO World Congress, vol. II (1997) 108.
4. Manoochehri F., Ikonen E., Liedquist L. Color Res. Appl. 21:1996;440.
5. Haapalinna A., Kärhä P., Ikonen E. Appl. Opt. 37:1998;729.
6. M. Born, E. Wolf, Principles of Optics, Pergamon Press, Oxford, 1965, pp. 40, 632-633.
7. Mielenz K. NBS Special publication. 378:1973;81.
8. Cunsolo S., Dore P., Varsamnis C.P. Appl. Opt. 31:1992;4554.
9. Hsia J., Weidner V. Appl. Opt. 19:1980;1268.
10. A. Haapalinna, F. Manoochehri, E. Ikonen, in preparation.
11. McCrone Scientific Ltd., London, UK, data sheets.
12. Frehlich R.G. Appl. Opt. 31:1992;5926.
13. J.F. Verrill, NPL report QMS XXX (1996).
14. Melles Griot Inc. Opt. Guide. 5:1990;3-7.
15. Dynasil Corporation of America, NJ, Catalog 702-B.
16. Malitson I.H. J. Opt. Soc. 55:1965;1205.