A cross-measurement procedure (CMP) for near noise-free imaging in scanning microscopes

Ultramicroscopy

Volumn 76, Issue 1-2, 1999, Pages 39-47

  Anguiano, Eloy ^a   Aguilar, Miguel ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

Image enhancement; Image processing; Noise filter; Probe microscopy

Indexed keywords

ARTICLE; COMPUTER PROGRAM; FILTER; IMAGE QUALITY; MEASUREMENT; SCANNING ELECTRON MICROSCOPE; SIGNAL NOISE RATIO;

EID: 0033010865     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00074-6     Document Type: Article

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