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Volumn 78, Issue 1-4, 1999, Pages 63-72

Three-dimensional atomic scale microscopy with the atom probe

Author keywords

3D atom probe; Analytical microscopy; Interfacial segregation; Long range order; Unmixing

Indexed keywords

EVAPORATION; INTERFACES (MATERIALS); IONIZATION; MASS SPECTROMETRY; METALS; PARTICLE DETECTORS; SEGREGATION (METALLOGRAPHY);

EID: 0033007090     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00046-7     Document Type: Conference Paper
Times cited : (23)

References (28)
  • 20
    • 0024701113 scopus 로고
    • Kim Y.W. JOM. 41:1989;24.
    • (1989) JOM. , vol.41 , pp. 24
    • Kim, Y.W.1
  • 26
    • 0001532385 scopus 로고
    • L.A. Johnson, D.P. Pope, Sitiegler J.O. Pittsburgh: Materials Research Society
    • Kim Y.W. Johnson L.A., Pope D.P., Sitiegler J.O. High-Temperature Ordered Intermetallic Alloys IV. Vol. 213:1991;777 Materials Research Society, Pittsburgh.
    • (1991) High-Temperature Ordered Intermetallic Alloys IV , vol.213 , pp. 777
    • Kim, Y.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.