![]() |
Volumn 78, Issue 1-4, 1999, Pages 63-72
|
Three-dimensional atomic scale microscopy with the atom probe
|
Author keywords
3D atom probe; Analytical microscopy; Interfacial segregation; Long range order; Unmixing
|
Indexed keywords
EVAPORATION;
INTERFACES (MATERIALS);
IONIZATION;
MASS SPECTROMETRY;
METALS;
PARTICLE DETECTORS;
SEGREGATION (METALLOGRAPHY);
THREE DIMENSIONAL ATOMIC SCALE MICROSCOPY;
TOMOGRAPHIC ATOM PROBES (TAP);
MICROSCOPES;
ALLOY;
ALUMINUM;
CHROMIUM;
METAL;
NANOPARTICLE;
NICKEL;
TITANIUM;
APPARATUS;
ATOM;
ATOMIC PARTICLE;
CONFERENCE PAPER;
ELECTRON MICROSCOPY;
IMAGE ANALYSIS;
IONIZATION;
MASS SPECTROMETRY;
OPTICAL RESOLUTION;
THREE DIMENSIONAL IMAGING;
|
EID: 0033007090
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(99)00046-7 Document Type: Conference Paper |
Times cited : (23)
|
References (28)
|