A parametric method to resolve the ill-posed nature of the EIT reconstruction problem: A simulation study

Annals of the New York Academy of Sciences

Volumn 873, Issue , 1999, Pages 440-453

  De Munck, J C ^a   Faes, Th J C ^a   Hermans, A J ^b   Heethaar, R M ^a  

^a VU UNIVERSITY MEDICAL CENTER   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER ASSISTED IMPEDANCE TOMOGRAPHY; CONDUCTANCE; CONFERENCE PAPER; IMAGE RECONSTRUCTION; MATHEMATICAL ANALYSIS;

EID: 0032986327     PISSN: 00778923     EISSN: None     Source Type: Book Series    
DOI: 10.1111/j.1749-6632.1999.tb09493.x     Document Type: Conference Paper

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