Advantages of elemental mapping by high-voltage EFTEM

Ultramicroscopy

Volumn 78, Issue 1-4, 1999, Pages 233-240

  Kurata, Hiroki ^a  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

Elemental mapping; Energy filtering transmission electron microscopy (EFTEM); High voltage electron microscopy (HVEM)

Indexed keywords

ELECTRON MICROSCOPES; ELECTRON SCATTERING; WAVE FILTERS;

ELEMENTAL MAPPING; ENERGY FILTERING TRANSMISSION ELECTRON MICROSCOPY (EFTEM); HIGH VOLTAGE ELECTRON MICROSCOPY (HVEM);

TRANSMISSION ELECTRON MICROSCOPY;

ELEMENT;

CONFERENCE PAPER; ELECTRON BEAM; ELECTRON DIFFRACTION; ENERGY TRANSFER; FILTER; IMAGING SYSTEM; OPTICAL RESOLUTION; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032967538     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00023-6     Document Type: Conference Paper

References (15)

1. Reimer L. Springer Series in Optical Science. 1995;Springer, Berlin.
2. Berger A., Kohl H. Microsc. Microanal. Microstruct. 3:1992;159.
3. Berger A., Kohl H. Optik. 92:1993;175.
4. Zanchi G., Sevely J., Jouffrey B. J. Microsc. Spectrosc. Electron. 2:1977;95.
5. Gubbens A.J., Kraus B., Krivanek O.L., Mooney P.E. Ultramicroscopy. 59:1995;255.
6. Krivanek O.L., Gubbens A.J., Dellby N., Meyer C.E. Microsc. Microanal. Microstruct. 3:1992;187.
7. Kurata H., Moriguchi S., Isoda S., Kobayashi T. J. Electron Microsc. 45:1996;79.
8. Krivanek O.L., Kundmann M.K., Kimoto K. J. Microsc. 180:1995;277.
9. Kohl H., Rose H. Adv. Electron. Electron Phys. 65:1985;173.
10. Isoda S., Moriguchi S., Kurata H., Kobayashi T., Uyeda N. Ultramicroscopy. 39:1991;247.
11. Kohl H. Ultramicroscopy. 11:1983;53.
12. Fano U. Phys. Rev. 102:1956;385.
13. Kurata H., Wahlbring P., Isoda S., Kobayashi T. Micron. 28:1997;381.
14. Egerton R.F., Leapman R.D. Reimer L. Energy-Filtering Transmission Electron Microscope. 1995;267 Springer, Berlin.
15. Wang Z.L., Shapiro A.J. Ultramicroscopy. 60:1995;115.