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Volumn 26, Issue 4, 1999, Pages 533-537
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Correcting for electron contamination at dose maximum in photon beams
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Author keywords
Beam quality specification; Electron contamination; Monte Carlo; Photon beam dosimetry
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Indexed keywords
CONTAMINATION;
PARTICLE BEAMS;
PHANTOMS;
PHOTOELECTRONS;
PHOTONS;
BEAM HARDENING;
DEPTH-DOSE DATA;
ELECTRON CONTAMINATION;
FOIL THICKNESS;
MONTE CARLO CALCULATION;
PHANTOM SURFACE;
PHOTON BEAMS;
QUALITY SPECIFICATIONS;
MONTE CARLO METHODS;
ARTICLE;
ELECTRON;
FOIL;
MATHEMATICAL ANALYSIS;
PHANTOM;
PHOTON;
PRIORITY JOURNAL;
RADIATION BEAM;
RADIATION DEPTH DOSE;
RADIATION DOSE;
RADIOACTIVE CONTAMINATION;
SYSTEM ANALYSIS;
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EID: 0032941896
PISSN: 00942405
EISSN: None
Source Type: Journal
DOI: 10.1118/1.598553 Document Type: Article |
Times cited : (19)
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References (10)
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