Experimental determination of section sensitivity profiles and image noise in electron beam computed tomography

Medical Physics

Volumn 26, Issue 2, 1999, Pages 287-295

  McCollough, Cynthia H ^a   Kanal, Kalpana M ^a   Lannutti, Nicholas ^a   Ryan, Kelly J ^a  

^a MAYO CLINIC   (United States)

Author keywords

CT image quality; CT physics; Electron beam CT; Spiral CT technology

Indexed keywords

ELECTRON BEAM COMPUTED TOMOGRAPHY; ELECTRON BEAMS; FULL WIDTH AT HALF MAXIMUM; PHANTOMS;

CT IMAGE; EXPERIMENTAL DETERMINATION; EXPOSURE-TIME; MEASURE NOISE; SECTION THICKNESS; SENSITIVITY PROFILES; SPIRAL CT; WATER PHANTOM;

VANADIUM STEEL;

ARTICLE; COMPUTER ASSISTED TOMOGRAPHY; ELECTRON BEAM; IMAGE ANALYSIS; IMAGE QUALITY; NOISE; PHANTOM; PRIORITY JOURNAL; RADIATION PHYSICS;

EID: 0032913761     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.598515     Document Type: Article

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