A new specimen preparation method for cross-section TEM using diamond powders

Journal of Electron Microscopy

Volumn 48, Issue 2, 1999, Pages 131-137

  Kawasaki, Masahiro ^a   Yoshioka, Tadanori ^a   Shiojiri, Makoto ^b  

^a JEOL LTD   (Japan)

^b KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Cross sectional TEM; Diamond powder; Etching rate; Ion milling; TEM specimen preparation

Indexed keywords

DIAMONDS; ETCHING; ION BEAMS; ION BOMBARDMENT; MAGNETIC MATERIALS; MILLING (MACHINING); POWDERS; TRANSMISSION ELECTRON MICROSCOPY;

CROSS-SECTION TRANSMISSION; CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPE; DIAMOND POWDERS; ETCHING RATE; ION MILLING; MICROSCOPE SPECIMENS; SPECIMEN PREPARATION METHOD; TRANSMISSION ELECTRON; TRANSMISSION ELECTRON MICROSCOPE SPECIMEN PREPARATION;

SPECIMEN PREPARATION;

EID: 0032910927     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023659     Document Type: Article

References (9)

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