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Volumn 71, Issue 1, 1999, Pages 167-173

Migration and diffusion coupled with a fast preceding reaction. Voltammetry at a microelectrode

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; DIFFUSION; HYDROGEN BOND; IONIC STRENGTH; MATHEMATICAL COMPUTING; MATHEMATICAL MODEL; MICROELECTRODE; POTENTIOMETRY; REDUCTION; SIMULATION;

EID: 0032907863     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac980425s     Document Type: Article
Times cited : (26)

References (5)
  • 1
    • 0000382693 scopus 로고
    • Voltammetry at ultramicroelectrodes
    • Bard A. J., Ed.; Marcel Dekker: New York
    • Wightman, R. M.; Wipf, D. O. Voltammetry at Ultramicroelectrodes. In Electroanalytical Chemistry, Bard A. J., Ed.; Marcel Dekker: New York, 1988; Vol. 15.
    • (1988) Electroanalytical Chemistry , vol.15
    • Wightman, R.M.1    Wipf, D.O.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.