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Volumn 71, Issue 1, 1999, Pages 167-173
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Migration and diffusion coupled with a fast preceding reaction. Voltammetry at a microelectrode
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ARTICLE;
DIFFUSION;
HYDROGEN BOND;
IONIC STRENGTH;
MATHEMATICAL COMPUTING;
MATHEMATICAL MODEL;
MICROELECTRODE;
POTENTIOMETRY;
REDUCTION;
SIMULATION;
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EID: 0032907863
PISSN: 00032700
EISSN: None
Source Type: Journal
DOI: 10.1021/ac980425s Document Type: Article |
Times cited : (26)
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References (5)
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