Highly resistant regression and object matching

Biometrics

Volumn 55, Issue 3, 1999, Pages 820-825

  Dryden, Ian L ^a   Walker, Gary ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

Affine; Landmarks; Least median of squares; Linear; Matching; Procrustes; Regression; Resistant; S estimator; Shape; Similarity; Subsets

Indexed keywords

FEATURE SELECTION; SET THEORY;

AFFINE; LANDMARK; LEAST MEDIAN OF SQUARES; LINEAR; MATCHINGS; PROCRUSTES; REGRESSION; RESISTANT; S-ESTIMATORS; SHAPE; SIMILARITY; SUBSET;

LEAST SQUARES APPROXIMATIONS;

ARTICLE; GEL ELECTROPHORESIS; REGRESSION ANALYSIS; SIMULATION; STATISTICAL ANALYSIS; STATISTICAL MODEL; VARIANCE;

EID: 0032886309     PISSN: 0006341X     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0006-341X.1999.00820.x     Document Type: Article

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