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Volumn 42, Issue 22, 1999, Pages 4131-4142

Theoretical analysis of wafer temperature dynamics in a low pressure chemical vapor deposition reactor

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL REACTORS; NUMERICAL ANALYSIS; SILICON WAFERS; TEMPERATURE; TEMPERATURE DISTRIBUTION;

EID: 0032880277     PISSN: 00179310     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0017-9310(99)00069-1     Document Type: Article
Times cited : (11)

References (14)
  • 1
    • 0017478541 scopus 로고
    • Low pressure CVD processes for poly, nitride, and oxide
    • Rosler R.S. Low pressure CVD processes for poly, nitride, and oxide. Solid State Technology. 20:1977;63-70.
    • (1977) Solid State Technology , vol.20 , pp. 63-70
    • Rosler, R.S.1
  • 4
    • 0014583140 scopus 로고
    • Temperature distribution and stresses in circular wafers in a row during radiative cooling
    • Hu S.M. Temperature distribution and stresses in circular wafers in a row during radiative cooling. Journal of Applied Physics. 40:1969;4413-4423.
    • (1969) Journal of Applied Physics , vol.40 , pp. 4413-4423
    • Hu, S.M.1
  • 5
    • 36549092171 scopus 로고
    • Modeling and control of the wafer temperatures in a diffusion furnace
    • Van Schravendijk B.J., De Koning W.L. Modeling and control of the wafer temperatures in a diffusion furnace. Journal of Applied Physics. 61:1987;1620-1627.
    • (1987) Journal of Applied Physics , vol.61 , pp. 1620-1627
    • Van Schravendijk, B.J.1    De Koning, W.L.2
  • 6
    • 0026830171 scopus 로고
    • Optimal control of the wafer temperatures in diffusion/LPCVD reactors
    • De Waard H., De Koning W.L. Optimal control of the wafer temperatures in diffusion/LPCVD reactors. Automatica. 28:1992;243-253.
    • (1992) Automatica , vol.28 , pp. 243-253
    • De Waard, H.1    De Koning, W.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.