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Volumn 42, Issue 22, 1999, Pages 4131-4142
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Theoretical analysis of wafer temperature dynamics in a low pressure chemical vapor deposition reactor
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL REACTORS;
NUMERICAL ANALYSIS;
SILICON WAFERS;
TEMPERATURE;
TEMPERATURE DISTRIBUTION;
DIFFUSE REFLECTION;
LOW PRESSURE CHEMICAL VAPOR DEPOSITION REACTOR;
TEMPERATURE VARIATIONS;
THERMOANALYSIS;
FILM;
REACTOR;
SEMICONDUCTOR;
TEMPERATURE DISTRIBUTION;
VAPOR DEPOSITION;
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EID: 0032880277
PISSN: 00179310
EISSN: None
Source Type: Journal
DOI: 10.1016/S0017-9310(99)00069-1 Document Type: Article |
Times cited : (11)
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References (14)
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