Atomic force microscopy of single crystal surfaces during plastic deformation

Probe Microscopy

Volumn 1, Issue 4, 1999, Pages 313-321

  Coupeau, C ^a   Girard, J C ^a   Grilhe, J ^a  

^a UNIVERSITÉ DE POITIERS   (France)

Author keywords

AFM; Dislocations; Slip lines

Indexed keywords

PLASTIC;

ARTICLE; ATOMIC FORCE MICROSCOPY; CRYSTAL; PLASTICITY; SURFACE PROPERTY;

EID: 0032879548     PISSN: 1355185X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (28)