Surface chemical characterization and surface diffraction effects of real margarite (001): An angle-resolved XPS investigation

American Mineralogist

Volumn 84, Issue 4, 1999, Pages 629-638

  Biino, Giuseppe G ^a,b   Mannella, Norman ^b,c   Alexander, Kay ^b,c   Bongjin, Mun ^b,c   Fadley, Charles S ^b,c  

^a Le Pavillon   (Switzerland)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPTH PROFILING; DIFFRACTION; PHOTOELECTRONS; PHOTONS; SILICON;

ANGLE-RESOLVED X-RAY PHOTOELECTRON SPECTROSCOPY; CHEMICAL COMPOSITIONS; MEASURING TECHNIQUE; NEAR SURFACE REGIONS; PHOTOELECTRON DIFFRACTION; SINGLE SCATTERING CLUSTER CALCULATIONS; SURFACE DIFFRACTION; SURFACE SENSITIVITY;

X RAY PHOTOELECTRON SPECTROSCOPY;

CRYSTAL CHEMISTRY; MARGARITE; MICA; SURFACE LAYER;

EID: 0032873529     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-1999-0416     Document Type: Article

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