Charge-transfer complexes of metal dithiolenes XXVI azobipyridinium dications and radical monocations as acceptors

European Journal of Inorganic Chemistry

Volumn , Issue 8, 1999, Pages 1259-1269

  Handrosch, Carsten ^a   Dinnebier, Robert ^b   Bondarenko, Gennadij ^c   Bothe, Eberhard ^d   Heinemann, Frank ^a   Kisch, Horst ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b UNIVERSITY OF BAYREUTH   (Germany)

^c SOUTHERN FEDERAL UNIVERSITY   (Russian Federation)

^d MAX PLANCK INSTITUTE FOR CHEMICAL ENERGY CONVERSION   (Germany)

Author keywords

Azo compounds; Charge transfer complexes; Electrical conductivity; High resolution X ray powder diffractometry; Metal dithiolenes

Indexed keywords

CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTRON SPIN RESONANCE SPECTROSCOPY; FREE RADICAL REACTIONS; IONS; KETONES; NICKEL; PALLADIUM; PELLETIZING; POWDER METALS; REDOX REACTIONS; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

AZO COMPOUND; CHARGE-TRANSFER COMPLEX; DICATIONS; DITHIOLATES; ELECTRICAL CONDUCTIVITY; HIGH RESOLUTION; HIGH-RESOLUTION X-RAY POWDER DIFFRACTOMETRY; ION PAIRS; METAL DITHIOLENES; X-RAY POWDER DIFFRACTOMETRY;

CHARGE TRANSFER;

AZO COMPOUND; CATION; KETONE; METAL COMPLEX; PYRIDINIUM DERIVATIVE; THIOL DERIVATIVE;

ARTICLE; CALCULATION; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTRON SPIN RESONANCE; ELECTRON TRANSPORT; OXIDATION REDUCTION REACTION; ULTRAVIOLET SPECTROSCOPY; X RAY DIFFRACTION;

EID: 0032865601     PISSN: 14341948     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1099-0682(199908)1999:8<1259::aid-ejic1259>3.0.co;2-i     Document Type: Article

References (60)

1. U. Ammon, C. Chiorboli, W. Dümler, G. Grampp, F. Scandola, H. Kisch, J. Phys. Chem. A 1997, 101, 6876-6882.
2. G. J. Ashwell (Ed.), Molecular Electronics, Research Studies Press Ltd., Taunton, Somerset, England, 1992.
3. F. L. Carter (Ed.), Molecular Electronic Devices, Marcel Dekker Inc., New York, Basel, 1992.
4. I. Nunn, B. Eisen, R. Benedix, H. Kisch, Inorg. Chem. 1994, 33, 5079-5085.
5. H. Kisch, Coord. Chem. Rev. 1993, 125, 155-172.
6. H. Kisch, Coord. Chem. Rev. 1997, 159, 385-396.
7. 2 obtained from application of the Hush model (see ref.[3]).
8. G. Schmauch, F. Knoch, H. Kisch, Chem. Ber. 1995, 128, 303.
9. G. Schmauch, F. Knoch, H. Kisch, Chem. Ber. 1994, 127, 287-294.
10. J. E. Rockley, L. A. Summers, Aust. J. Chem. 1981, 34, 2683-2686.
11. H. Rau, Angew. Chem. 1973, 85, 248-258.
12. C. H. Huang et al. J. Phys.Chem. 1996, 100, 15525-15531.
13. E. M. Kosower, J. L. Cotter, J. Am. Chem. Soc. 1964, 86, 5524-5527.
14. M. Wolszczak, Cz. Stradowski, Radiat. Phys. Chem. 1989, 33, 355-359.
15. S. Hünig, D. Scheutzow, P. Cársky, R. Zahradnik, J. Phys. Chem. 1971, 75, 335-339.
16. T. Watanabe, K. Honda, J. Phys. Chem.1982, 86, 2617-2619.
17. A. L. Black, L. A. Summers, J. Chem. Soc. (C) 1970, 2394-2395.
18. D. J. Barker, L. A. Summers, R. P. Cooney, G. R. Clark, C. E. F. Rickard, J. Mol. Struct. 1987, 159, 265-278.
19. J. I. Langford, D. Louër, Rep. Prog. Physics 1996, 59, 131-234.
20. N. Masciocchi, A. J. Sironi, J. Chem. Soc. Dalton Trans. 1997, 4643-4650.
21. C. Giacovazzo, Acta Cryst. 1996, A52, 331-339.
22. K. D. M. Harris, M. Tremayne, Chem. Mater. 1996, 2554-2570.
23. U. M. Schmidt, R. E. Dinnebier, J. Appl. Cryst. 1998, in press.
24. H. Kisch, A. Fernández, Y. Wakatsuki, H. Yamazaki, Z. Naturforsch. 1985, 40b, 292-297.
25. B.-Z. Shan, X.-M. Zhang, X.-Z. You, H.-K. Fun, K. Sivakumar, Acta Cryst. 1996, C52, 1148-1150.
26. J. Morgado, I. C. Santos, L. F. Veiros, R. T. Henriques, M. T. Duarte, M. Almeida, L. Alcacer: J. Mater. Chem. 1997, 7, 2387-2392.
27. J. A. McCleverty, Prog. Inorg. Chem. 1968, 10, 49-219.
28. M. Lemke, F. Knoch, H. Kisch, Acta Cryst. 1993, C49, 1630-1632.
29. To take distances lower than the sum of the van der Waals radii as criterion is not unambiguous since weak electrostatic forces reach much longer. e.g. T. Steiner, J. Chem. Soc. Chem. Commun. 1997, 727.
30. A. Bondi, J. Phys. Chem. 1964, 68, 441-451.
31. E. Billig, R. Williams, I. Bernal, J. H. Waters, H. Gray, Inorg. Chem. 1964, 3, 663-666.
32. O. Lindqvist, L. Andersen, J. Sieler, G. Steinmecke, E. Hoyer, Acta Chem. Scand. A 1982, 36, 855-856.
33. R. Kato, T. Mori, A. Kobayashi, Y. Sasaki, H. Kobayashi, Chem. Lett. 1984, 1 -4.
34. L. Valade, J.-P. Legros, M. Bousseau, P. Cassoux, J. Chem. Soc. Dalton Trans. 1985, 783-794.
35. D. Mentzafos, A. Hountas, A. Terzis, Acta Cryst. 1988, C44, 1550-1553.
36. P. Cassoux, L. Valade, Coord. Chem. Rev. 1991, 110, 115-160.
37. Kochurani, H. B. Singh, J. P. Jasinski, E. S. Paight, R. J. Butcher, Polyhedron 1997, 16, 3505-3510.
38. pf1[g] Sh. Sun, P. Wu, D. Zhu, Synth. Met. 1997, 88, 243-247.
39. O. Lindqvist, L. Sjölin, J. Sieler, G. Steinmecke, E. Hoyer, Acta Chem.Scand. A 1979, 33, 445-448.
40. C. L. Bird, A. T. Kuhn, J. Chem. Soc. Rev. 1980, 10, 49-82.
41. H. Wolkers, R. Stegmann, G. Frenking, K. Dehnicke, D. Fenske, G. Baum, Z. Naturforsch. 1993, 48 b, 1341-1347.
42. A. Davison, N. Edelstein; R. H. Holm, A. H. Maki, Inorg. Chem. 1963, 6, 1227-1232.
43. A. Davison, R. H. Holm, Inorg. Synth. 1966, 8-26.
44. B. Eisen, Doctoral Thesis, University of Erlangen-Nürnberg, 1995.
45. A. E. Underhill et al., J. Phys. Cond. Matter. 1991, 3, 933-954.
46. R. D. Schmitt, A. H. Maki, J. Am. Chem. Soc. 1968, 90, 2288-2292.
47. Y. Sakamoto, G. E. Matsubayashi, T. Tanaka, Inorg. Chim. Acta 1986, 113, 137-141.
48. B. Karvaly, I. Hevesi, Z. Naturforsch. 1971, 26a, 245.
49. J. W. Visser, J. Appl. Cryst. 1969, 2, 89-95.
50. A. leBail, H. Duroy, J. L. Fourquet, Mat. Res. Bull. 1988, 23, 447-452.
51. A. C. Larson, R. B. Von Dreele, Los Alamos National Laboratory Report LAUR, 1990, 86-748.
52. P. Thompson, D. E. Cox, J. B. Hastings, J. Appl. Cryst. 1987, 20, 79.
53. L. W. Finger, D. E. Cox, A. P. Jephcoat, J. Appl. Cryst. 1994, 27, 892.
54. R. E. Dinnebier, Dinnebier, GUFI, a program for measurement and evaluation of powder pattern: Heidelberger Geowiss. Abh. 68, ISBN 3-89257-067-1, 1993.
55. H. M. Rietveld, J. Appl. Cryst. 1969, 2, 65-71.
56. SHELXTL 5.03 for Siemens Crystallographic Research Systems, Copyright 1995 by Siemens Analytical X-ray Instruments Inc., Madison, WI, USA.
57. N. Campbell, A. W. Henderson, D. Taylor, J. Chem Soc. 1953, 1281-1285.
58. A. L. Black, L. A. Summers, J. Chem. Soc. (C) 1970, 2394 f.
59. R. F. Homer, T. E. Tomlinson. J. Chem. Soc. 1960, 2498 ff.
60. G. Steinmecke, H. J. Sieler, R. Krimse, E. Hoyer, Phosphorus and Sulfur 1979, 7, 49.