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Volumn 195, Issue 1, 1999, Pages 17-22
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A method for characterizing longitudinal chromatic aberration of microscope objectives using a confocal optical system
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Author keywords
Chromatic aberration; Confocal microscopy
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Indexed keywords
ABERRATIONS;
CONFOCAL MICROSCOPY;
OPTICAL SYSTEMS;
A-PLANE;
AXIAL RESPONSE;
CHROMATIC ABERRATION;
CONFOCAL MICROSCOPES;
CONFOCAL OPTICAL SYSTEMS;
FOCAL REGIONS;
FOCAL SHIFTS;
MICROSCOPE OBJECTIVE;
NOVEL METHODS;
SURFACE PROFILES;
MICROSCOPES;
ARTICLE;
CONFOCAL MICROSCOPY;
IMAGE PROCESSING;
LIGHT REFRACTION;
OPTICS;
PRIORITY JOURNAL;
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EID: 0032864866
PISSN: 00222720
EISSN: None
Source Type: Journal
DOI: 10.1046/j.1365-2818.1999.00488.x Document Type: Article |
Times cited : (12)
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References (7)
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