SCOPUS 정보 검색 플랫폼

Volumn 285, Issue 5436, 1999, Pages 2080-2081

Pushing the limits

Author keywords

[No Author keywords available]

Indexed keywords

METAL OXIDE; SILICON;

DEVICE; ELECTRIC FIELD; ELECTRODE; ELECTRON TRANSPORT; PRIORITY JOURNAL; SEMICONDUCTOR; SHORT SURVEY; TECHNOLOGY; THERMODYNAMICS;

EID: 0032842922 PISSN: 00368075 EISSN: None Source Type: Journal
DOI: None Document Type: Short Survey

Times cited : (101)

References (7)

1
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- G. Moore, IEDM Tech. Dig. (1975), p. 11.
- (1975) IEDM Tech. Dig. , pp. 11
- Moore, G.¹

2
- 0016116644
- R. H. Denard et al., IEEE J. Solid-State Circuits SC-9, 256 (1974).
- (1974) IEEE J. Solid-state Circuits , vol.SC-9 , pp. 256
- Denard, R.H.¹

3
- 0023860584
- K. S. Jones, S. Prussin, E. R. Weber, Appl. Phys. A 45, 1 (1988).
- (1988) Appl. Phys. A , vol.45 , pp. 1
- Jones, K.S.¹ Prussin, S.² Weber, E.R.³

4
- 0002827241
- J. Maserjian and G. P. Petersson, Appl. Phys. Lett. 25, 50 (1974).
- (1974) Appl. Phys. Lett. , vol.25 , pp. 50
- Maserjian, J.¹ Petersson, G.P.²

5
- 25044462178
- H. S. Momose et al., IEDM Tech. Dig. (1994), p. 593.
- IEDM Tech. Dig. , vol.1994 , pp. 593
- Momose, H.S.¹

6
- 0000901940
- B. Hoeneisen and C. A. Mead, Solid-State Electron. 15, 819 (1972).
- (1972) Solid-state Electron. , vol.15 , pp. 819
- Hoeneisen, B.¹ Mead, C.A.²

7
- 0002705635
- S. Thompson, P. Packan, M. Bohr, Intel Tech. J. Q3, 1 (1998).
- (1998) Intel Tech. J. , vol.Q3 , pp. 1
- Thompson, S.¹ Packan, P.² Bohr, M.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.