Studies on the reactive polysulfone-polyamide interface: Interfacial thickness and adhesion

Polymer

Volumn 40, Issue 23, 1999, Pages 6381-6393

  Koriyama, Hiroshi ^a   Oyama, Hideko T ^a   Ougizawa, Toshiaki ^a   Inoue, Takashi ^a   Weber, Martin ^b   Koch, Eckhard ^b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b Polymer Research Laboratory   (Germany)

Author keywords

Ellipsometry; Polysulfone amorphous polyamide; Reactive interface

Indexed keywords

ADHESION; AMORPHOUS MATERIALS; BLOCK COPOLYMERS; ELLIPSOMETRY; GRAFT COPOLYMERS; INTERFACES (MATERIALS); MOLECULAR STRUCTURE; POLYAMIDES; POLYSULFONES;

INTERFACIAL THICKNESS;

POLYMER BLENDS;

COPOLYMER; POLYAMIDE; POLYSULFONE;

ARTICLE; CHEMICAL INTERACTION; CHEMICAL REACTION; POLYMERIZATION; STRUCTURE ACTIVITY RELATION; STRUCTURE ANALYSIS; THICKNESS;

EID: 0032842154     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0032-3861(98)00856-8     Document Type: Article

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