Applications of index matching in reflectometry, SANS and Brewster angle microscopy

Current Opinion in Colloid and Interface Science

Volumn 4, Issue 3, 1999, Pages 186-189

  Webster, John ^a   Langridge, Sean ^a  

^a RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

Contrast matching; Microscopy; Neutron scattering

Indexed keywords

LIGHT SCATTERING; MICROSCOPY; NEUTRON SCATTERING; REFLECTOMETRY; REFRACTION INDEX; SHORT SURVEY; SURFACE PROPERTY;

EID: 0032826756     PISSN: 13590294     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-0294(99)00040-0     Document Type: Article

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