SPM tip visualization through deconvolution using various characterizers: Optimization of the protocol for obtaining true surface topography from experimentally acquired images

Probe Microscopy

Volumn 1, Issue 4, 1999, Pages 355-364

  Markiewicz, P ^a   Cohen, S R ^a   Efimov, A ^a   Ovchinnikov, D V ^a   Bukharaev, A A ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

Deconvolution; Erosion; Reconstruction; Scanning probe microscopy; Tip characterization

Indexed keywords

ARTICLE; ELECTRON MICROSCOPY; EROSION; IMAGE RECONSTRUCTION; SENSOR; TECHNIQUE;

EID: 0032826184     PISSN: 1355185X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (23)