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Volumn 84, Issue 1-4, 1999, Pages 247-251
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Characterisation and modelling of the 450 K TSL peak of alpha alumina by the simultaneous analysis of TSL, TSC and TSEE
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM OXIDE;
ALPHA RADIATION;
COMPARATIVE STUDY;
CONFERENCE PAPER;
DOSIMETRY;
ELECTRON;
ELECTRON BEAM;
ELECTRONICS;
IONIZING RADIATION;
MATHEMATICAL MODEL;
THERMAL CONDUCTIVITY;
THERMOLUMINESCENCE;
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EID: 0032812736
PISSN: 01448420
EISSN: None
Source Type: Journal
DOI: 10.1093/oxfordjournals.rpd.a032729 Document Type: Conference Paper |
Times cited : (6)
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References (8)
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