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Optics Communications

Volumn 159, Issue 1-3, 1999, Pages 80-83

Pressure broadening in the second overtone of NO, measured with a near infrared DFB diode laser

(5) Snels, Marcel a,b Corsi, Chiara a,c D'Amato, Francesco a,d De Rosa, Maurizio a,e Modugno, Giovanni a,f

a UNIVERSITY OF FLORENCE (Italy)

b CNR (Italy)

c UNIVERSITY OF FLORENCE (Italy)

d Divisione Fisica Applicata (Italy)

e SIT Srl (Italy)

f SCUOLA NORMALE SUPERIORE (Italy)

Author keywords

Collisional linewidth; Diode laser; Line strength; Molecular spectroscopy

Indexed keywords

DISTRIBUTED FEEDBACK LASERS; ELECTRON ENERGY LEVELS; LIGHT ABSORPTION; LIGHT EMISSION; MOLECULAR SPECTROSCOPY; NITROGEN OXIDES; PARAMETRIC AMPLIFIERS; SPECTROMETERS;

PRESSURE BROADENING;

SEMICONDUCTOR LASERS;

EID: 0032803646 PISSN: 00304018 EISSN: None Source Type: Journal
DOI: 10.1016/S0030-4018(98)00581-1 Document Type: Article

Times cited : (11)

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