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Volumn 84, Issue 1-4, 1999, Pages 551-554
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The use of the 210°C TL peak in quartz for retrospective dosimetry
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Author keywords
[No Author keywords available]
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Indexed keywords
SILICON DIOXIDE;
CERAMICS;
CONFERENCE PAPER;
RADIOSENSITIVITY;
RETROSPECTIVE STUDY;
SAMPLING;
THERMOLUMINESCENCE DOSIMETRY;
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EID: 0032784506
PISSN: 01448420
EISSN: None
Source Type: Journal
DOI: 10.1093/oxfordjournals.rpd.a032797 Document Type: Conference Paper |
Times cited : (28)
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References (10)
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