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Volumn 20, Issue 2-3, 1999, Pages 147-152

Gas-phase Selective Area Laser Deposition (SALD) joining of SiC

Author keywords

Engineering ceramics; Joining; Lasers

Indexed keywords

BENDING (DEFORMATION); CERAMIC MATERIALS; DEPOSITION; HYDROGEN; JOINING; LASER APPLICATIONS; LAYERED MANUFACTURING; MECHANICAL TESTING; SILANES; TUBES (COMPONENTS);

EID: 0032771379     PISSN: 02641275     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0261-3069(99)00021-7     Document Type: Article
Times cited : (21)

References (16)
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    • Ag effect on microstructures and strength of SiC/SiC joint brazed with Cu-Ag-Ti filler metals
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    • Tamia, T.1    Naka, M.2
  • 7
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    • Ceramic joining technology
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    • Singh, M.1
  • 8
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    • Ceramic joining by selective beam deposition
    • Bourell DL, Beaman JJ, Marcus HL, Crawford RH, Barlow JW, editors. Austin: The University of Texas
    • Tompkins JV, Birmingham BR, Marcus HL. Ceramic joining by selective beam deposition. In: Bourell DL, Beaman JJ, Marcus HL, Crawford RH, Barlow JW, editors. Solid Freeform Fabrication Symposium Proceedings 1995. Austin: The University of Texas, 1995:409-416.
    • (1995) Solid Freeform Fabrication Symposium Proceedings 1995 , pp. 409-416
    • Tompkins, J.V.1    Birmingham, B.R.2    Marcus, H.L.3
  • 11
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    • The structure of chemical vapor deposition silicon carbide
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    • Chin, J.1    Gantzel, P.K.2    Hudson, R.G.3
  • 12
    • 0000219574 scopus 로고
    • Growth characteristics of β-silicon carbide by chemical vapor deposition
    • Chu C-H, Lu Y-M, Hon M-H. Growth characteristics of β-silicon carbide by chemical vapor deposition. J Mater Sci 1992;27:3883-3888.
    • (1992) J Mater Sci , vol.27 , pp. 3883-3888
    • Chu, C.-H.1    Lu, Y.-M.2    Hon, M.-H.3
  • 14
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    • Effect of stacking faults on the X-ray diffraction profiles of β-SiC powders
    • Pujar W, Cawley JD. Effect of stacking faults on the X-ray diffraction profiles of β-SiC powders. J Am Ceramic Soc 1995;78:774-782.
    • (1995) J Am Ceramic Soc , vol.78 , pp. 774-782
    • Pujar, W.1    Cawley, J.D.2
  • 15
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    • Computer simulations of diffraction effects due to stacking faults in β-SiC: I Simulation results
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    • Pujar, V.V.1    Cawley, J.D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.