Tweezers for the nanotool kit

Science

Volumn 286, Issue 5447, 1999, Pages 2095-2096

  Mirkin, Chad A ^a  

^a Northwestern Chemistry Department   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; ELECTRONICS; ENGINEERING; EVOLUTION; PRIORITY JOURNAL; SCANNING TUNNELING MICROSCOPY; SHORT SURVEY; TECHNOLOGY;

EID: 0032764944     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.286.5447.2095     Document Type: Short Survey

References (12)

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8. S.C. Minne et al., Appl. Phys. Lett. 73, 1742 (1998).
9. S. Hong, J. Zhu, C. A. Mirkin, Science 286, 523 (1999).
10. J. J. Yao and N. C. MacDonald, Scanning Microsc. 6, 937 (1992).
11. A fixed two-probe device has already been demonstrated [S. Tsukamoto, B. Siu, N. Nakagiri, Rev. Sci. Instrum. 62, 1767 (1991)].
12. S. Hong is acknowledged for helpful comments.