Crystallization kinetics of thermally evaporated As 45.2 Te 46.6 In 8.2 thin films

Applied Surface Science

Volumn 137, Issue 1-3, 1999, Pages 150-156

  Moharram, A H ^a   Hafiz, M M ^a   Abu Sehly, A A ^a  

^a Assiut University   (Egypt)

Author keywords

As 45.2 Te 46.6 In 8.2 thin films; Conductivity; Crystallization kinetics

Indexed keywords

ACTIVATION ENERGY; CRYSTAL GROWTH; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY OF SOLIDS; EVAPORATION; GLASS; REACTION KINETICS; SUBSTRATES; TELLURIUM COMPOUNDS; THIN FILMS;

AVRAMI INDEX;

AMORPHOUS FILMS;

EID: 0032762005     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00467-X     Document Type: Article

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