Combination of specular and off-specular low-angle X-ray diffraction in the study of Co/Cu multilayers: Mesoscopic structure and layer oxidation

Surface and Interface Analysis

Volumn 27, Issue 1, 1999, Pages 1-7

  De Bernabe A ^a,b   Capitan M J ^b   Fischer, H E ^c   Quiros C ^d   Prieto, C ^a   Colino, J ^a   Mompean F ^a   Sanz, J M ^d  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c INSTITUT LAUE LANGEVIN   (France)

^d UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

Anomalous scattering; Interfaces; Multilayers; Off specular diffraction; Oxidation; Roughness; X ray reflectivity

Indexed keywords

COBALT; COPPER; FERMI LEVEL; INTERFACES (MATERIALS); MAGNETRON SPUTTERING; METALLOGRAPHIC MICROSTRUCTURE; OXIDATION; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

LOW ANGLE X RAY DIFFRACTION; MESOSCOPIC STRUCTURE; X RAY REFLECTIVITY;

MULTILAYERS;

EID: 0032761901     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199901)27:1<1::AID-SIA454>3.0.CO;2-P     Document Type: Article

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