Tapping mode atomic force microscopy analysis of a novel catalyzation technique on nonconducting substrates

Electrochemical and Solid-State Letters

Volumn 2, Issue 1, 1999, Pages 27-29

  Kuruganti, A S ^a   Chen, K S ^b   Kalu, E E ^a  

^a FAMU FSU COLLEGE OF ENGINEERING   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ATOMIC FORCE MICROSCOPY; CATALYSIS;

CATALYST PARTICLE FORMATION; NONCONDUCTING SUBSTRATES; TAPPING MODE ATOMIC FORCE MICROSCOPY;

SUBSTRATES;

EID: 0032760052     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1390723     Document Type: Article

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