Grain morphology, texture, and microhardness gradients in aluminum diffusion-bonded to aluminum oxide

Acta Materialia

Volumn 47, Issue 2, 1999, Pages 501-515

  Lin, C T ^a,b   Shen, Y L ^a,c   Becker, R ^b   Suresh, S ^a,d  

^a Massachusetts Institute of Technology Cambridge   (United States)

^b ALCOA TECHNICAL CENTER   (United States)

^c TEXAS INSTRUMENTS   (United States)

^d University of New Mexico   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ALUMINUM COMPOUNDS; CRYSTALLOGRAPHY; DIFFUSION; GRAIN BOUNDARIES; INTERFACES (MATERIALS); METALLOGRAPHY; MICROHARDNESS; RECRYSTALLIZATION (METALLURGY); TEXTURES; X RAY DIFFRACTION;

DIFFUSION BONDING;

BONDING;

EID: 0032759316     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(98)00361-9     Document Type: Article

References (8)

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