Structure and defects in thin C60 films

Fullerene Science and Technology

Volumn 7, Issue 1, 1999, Pages 59-75

  Manaila, R ^a   Geru, I I ^b   Fratiloiu, D ^a   Spoiala, D M ^b   Dihor, I T ^b   Devenyi, A ^a  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^b State University of Kishinev   (Moldova)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CRYSTAL LATTICES; ENERGY GAP; INFRARED SPECTROSCOPY; RAMAN SPECTROSCOPY; SINGLE CRYSTALS; STACKING FAULTS; SUBLIMATION; SUBSTRATES; THIN FILMS; ULTRAVIOLET SPECTROSCOPY; VAPOR DEPOSITION;

FULLERENE FILMS; LATTICE DISTORTIONS;

FULLERENES;

EID: 0032758762     PISSN: 1064122X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10641229909350270     Document Type: Article

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