Comparison of methods for calculating the heritability of adult field resistance to yellow rust and grain yield in spring wheat

Theoretical and Applied Genetics

Volumn 99, Issue 6, 1999, Pages 1075-1079

  Wagoire, W W ^a   Ortiz, R ^a,b   Hill, J ^a   Stolen O ^a  

^a UNIVERSITY OF COPENHAGEN   (Denmark)

^b INTERNATIONAL CROPS RESEARCH INSTITUTE FOR THE SEMI ARID TROPICS ICRISAT   (India)

Author keywords

Diallel cross; Parent offspring regression; Realized heritability; Triticum aestivum; Yellow rust; Yield

Indexed keywords

AFRICA; DIALLEL ANALYSIS; GENETIC RECOMBINATION; GENETIC VARIANCE; HERITABILITY; INBRED LINE; PLANT MICROORGANISM INTERACTION; REGRESSION ANALYSIS; RESISTANCE MANAGEMENT;

TRITICUM AESTIVUM;

EID: 0032749803     PISSN: 00405752     EISSN: None     Source Type: Journal    
DOI: 10.1007/s001220051417     Document Type: Article

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