High energy-resolution electron energy-loss spectroscopy study on Sr-doping dependence of the electronic structure of La(2-x)Sr(x)CuO4

Micron

Volumn 30, Issue 5, 1999, Pages 371-377

  Terauchi, M ^a   Tanaka, M ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Charge transfer transition; Dielectric function; Electron energy loss spectroscopy; High energy resolution; La(2 x)Sr(x)CuO4; Plasmon

Indexed keywords

EID: 0032742209     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(99)00040-2     Document Type: Article

References (7)

1. c superconductivity in the Ba-La-Cu-O system. Z. Phys. B. 64:1986;189-193.
2. 4. Phys. Rev. B. 36:1987;3971-3974.
3. 4 single crystal thin films. Phys. Rev. B. 39:1989;2312-2321.
4. Tanaka, M., Terauchi, M., Kuzuo, R., Tsuno, K., Ohyama, J., Harada, Y., 1992. A new high-resolution electron energy-loss spectroscopy microscope. Proceedings of the 50th Annual Meeting of EMSA. San Francisco Press, pp. 940-941.
5. 8. Jpn. J. Appl. Phys. 34:1995;L1524-L1527.
6. Terauchi M., Tanaka M., Tsuno K., Ishida M. Development of high energy-resolution electron energy-loss spectroscopy microscope. J. Microscopy. 194:1999;203-209.
7. 2 plane. Phys. Rev. B. 43:1991;7942-7954.