Diagnosing dynamic systems using trace patterns

Pattern Recognition Letters

Volumn 20, Issue 7, 1999, Pages 741-753

  Palshikar, Girish Keshav ^a   Khemani, Deepak ^b  

^a TATA RESEARCH DEVELOPMENT AND DESIGN CENTRE   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

Context free grammar; Diagnosis; Dynamic systems

Indexed keywords

CONTEXT FREE GRAMMARS; FEATURE EXTRACTION; MATHEMATICAL MODELS; PATTERN MATCHING; PERTURBATION TECHNIQUES; PROCESS CONTROL;

DYNAMIC SYSTEMS; TRACE PATTERNS;

OPTICAL CHARACTER RECOGNITION;

PATTERN RECOGNITION;

EID: 0032741385     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(99)00038-0     Document Type: Article

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