Design and test of MEMS

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 1999, Pages 270-275

  Courtois, B ^a   Karam, J M ^a   Mir, S ^a   Lubaszewski, M ^a   Szekely, V ^a   Rencz, M ^a   Hofmann, K ^a   Glesner, M ^a  

^a TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; MICROELECTRONICS;

COMPUTER AIDED TESTING (CAT);

MICROELECTROMECHANICAL DEVICES;

EID: 0032735755     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/icvd.1999.745160     Document Type: Conference Paper

References (19)