Test generator for segment delay faults

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 1999, Pages 484-491

  Heragu, Keerthi ^a   Patel, Janak H ^a   Agrawal, Vishwani D ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GENETIC ALGORITHMS; MATHEMATICAL MODELS; VECTORS;

TEST GENERATORS;

ELECTRIC NETWORK ANALYSIS;

EID: 0032734554     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (30)