A toolkit for parametric drift modelling of electronic components

Reliability Engineering and System Safety

Volumn 63, Issue 1, 1999, Pages 99-106

  Jones, J A ^a  

^a LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

Parametric drift; Statistical modelling; Wear out

Indexed keywords

ELECTRONIC EQUIPMENT; MATHEMATICAL MODELS; STATISTICAL METHODS;

PARAMETRIC DRIFT MODELING;

RELIABILITY THEORY;

EID: 0032728362     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0951-8320(98)00026-X     Document Type: Article

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