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Volumn 34, Issue 2, 1999, Pages 211-216
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Growth and Characterization of Silicon Crystallites on Laser Structured Glass
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Author keywords
Focused Ion Beam (FIB) method; Si on Glass; Vapour Liquid Solid (VLS) Growth
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL GROWTH;
GLASS;
ION BEAMS;
LASER PULSES;
MORPHOLOGY;
NUCLEATION;
POROSITY;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTOR GROWTH;
FOCUSED ION BEAMS (FIB);
VAPOR-LIQUID-SOLID (VLS) GROWTH;
SEMICONDUCTING SILICON;
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EID: 0032715893
PISSN: 02321300
EISSN: None
Source Type: Journal
DOI: 10.1002/(sici)1521-4079(199902)34:2<211::aid-crat211>3.0.co;2-p Document Type: Article |
Times cited : (2)
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References (11)
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