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Volumn 34, Issue 2, 1999, Pages 211-216

Growth and Characterization of Silicon Crystallites on Laser Structured Glass

Author keywords

Focused Ion Beam (FIB) method; Si on Glass; Vapour Liquid Solid (VLS) Growth

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; GLASS; ION BEAMS; LASER PULSES; MORPHOLOGY; NUCLEATION; POROSITY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR GROWTH;

EID: 0032715893     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1521-4079(199902)34:2<211::aid-crat211>3.0.co;2-p     Document Type: Article
Times cited : (2)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.