Improving the diagnosability of digital circuits

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 1999, Pages 629-634

  Ravikumar, C P ^a   Sharma, Manish ^a   Patney, R K ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRIC FAULT CURRENTS; INTEGRATED CIRCUIT TESTING;

DIAGNOSTIC RESOLUTION (DR);

DIGITAL INTEGRATED CIRCUITS;

EID: 0032715196     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/icvd.1999.745276     Document Type: Conference Paper

References (11)