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Volumn 24, Issue 1, 1999, Pages 26-31
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In situ X-ray diffraction and XAFS studies of expanded fluid selenium using synchrotron radiation
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL BONDS;
CONDENSATION;
DENSITY OF LIQUIDS;
ENERGY DISPERSIVE SPECTROSCOPY;
LIQUID METALS;
MOLECULAR STRUCTURE;
SEMICONDUCTING LIQUIDS;
SYNCHROTRON RADIATION;
X RAY DIFFRACTION ANALYSIS;
X RAY ABSORPTION FINE STRUCTURE (XAFS) SPECTROSCOPY;
SEMICONDUCTING SELENIUM;
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EID: 0032714765
PISSN: 08837694
EISSN: None
Source Type: Journal
DOI: 10.1557/S0883769400051691 Document Type: Article |
Times cited : (6)
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References (17)
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