SCOPUS 정보 검색 플랫폼

Solar Energy Materials and Solar Cells

Volumn 56, Issue 3-4, 1999, Pages 299-307

Analysis of durability in lithium nickel oxide electrochromic materials and devices

(5) Wen, S J a Kerr, J a Rubin, M a Slack, J a Von Rottkay, K a

a UNIVERSITY OF CALIFORNIA (United States)

Author keywords

Electrochromic tests; Lithium nickel oxide; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROCHROMISM; GAS ABSORPTION; GAS CHROMATOGRAPHY; INFRARED SPECTROSCOPY; LASER ABLATION; LITHIUM COMPOUNDS; POLYELECTROLYTES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPUTTER DEPOSITION; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

LITHIUM NICKEL OXIDE; NUCLEAR REACTION ANALYSIS;

ELECTROOPTICAL MATERIALS;

EID: 0032712457 PISSN: 09270248 EISSN: None Source Type: Journal
DOI: 10.1016/S0927-0248(98)00139-1 Document Type: Article

Times cited : (10)

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