Feature selection for multiple binary classification problems

Pattern Recognition Letters

Volumn 20, Issue 8, 1999, Pages 823-832

  Shapira, Yair ^a   Gath, Isak ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

Alternative partitions; Clustering; Feature selection; Transpose projection

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; PROBLEM SOLVING;

MULTIPLE BINARY CLASSIFICATION PROBLEMS;

FEATURE EXTRACTION;

CLASSIFICATION; IMAGE PROCESSING;

EID: 0032708886     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(99)00046-X     Document Type: Article

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