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Volumn 9, Issue 11, 1999, Pages 2893-2898

Sol-gel synthesis and characterization of Ag2S nanocrystallites in silica thin film glasses

Author keywords

[No Author keywords available]

Indexed keywords

GLASS; SILVER DIETHYLTHIOUREA; SILVER SULFIDE; TETRAETHYL SILICATE; UNCLASSIFIED DRUG;

EID: 0032699252     PISSN: 09599428     EISSN: None     Source Type: Journal    
DOI: 10.1039/a903377g     Document Type: Article
Times cited : (36)

References (48)
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    • (1984) Handbook of Chemistry and Physics
  • 27
  • 32
    • 0001664109 scopus 로고
    • ed. D. Briggs and M. P. Seah, J. Wiley & Sons, New York
    • 32 M. P. Seah, in Practical Surface Analysis, ed. D. Briggs and M. P. Seah, J. Wiley & Sons, New York, 1990, vol. 1, p. 543.
    • (1990) Practical Surface Analysis , vol.1 , pp. 543
    • Seah, M.P.1
  • 36
    • 0002501491 scopus 로고
    • ed. A. Benninghoven, K. T. F. Jansen, J. Tumpner and H. W. Werner, John Wiley, Chichester
    • 36 C. Pagura, S. Daolio and B. Facchin, in Secondary-Ion Mass Spectrometry SIMS VIII, ed. A. Benninghoven, K. T. F. Jansen, J. Tumpner and H. W. Werner, John Wiley, Chichester, 1992, p. 239.
    • (1992) Secondary-Ion Mass Spectrometry SIMS VIII , pp. 239
    • Pagura, C.1    Daolio, S.2    Facchin, B.3
  • 39
    • 0000144737 scopus 로고
    • ed. D. Briggs and M. P. Seah, J. Wiley & Sons, New York
    • 39 C. D. Wagner, in Practical Surface Analysis, ed. D. Briggs and M. P. Seah, J. Wiley & Sons, New York, 1990, vol. 1, pp. 595-604.
    • (1990) Practical Surface Analysis , vol.1 , pp. 595-604
    • Wagner, C.D.1
  • 43
    • 0009502066 scopus 로고
    • National Institute of Standards and Technology, Gaithersburg, MD
    • 43 XPS Photoelectron Spectroscopy Database, version 1.0, National Institute of Standards and Technology, Gaithersburg, MD, 1989.
    • (1989) XPS Photoelectron Spectroscopy Database, Version 1.0
  • 45
    • 0009476487 scopus 로고    scopus 로고
    • Pattern 14-72 on Joint Committee on Powder Diffraction Standard, International Centre for Diffraction Data, Newton Square, PA, 1992
    • 45 Pattern 14-72 on Joint Committee on Powder Diffraction Standard, International Centre for Diffraction Data, Newton Square, PA, 1992.
  • 46
    • 0009474672 scopus 로고    scopus 로고
    • Pattern 4-783 on Joint Committee on Powder Diffraction Standard, International Centre for Diffraction Data, Newton Square, PA, 1993
    • 46 Pattern 4-783 on Joint Committee on Powder Diffraction Standard, International Centre for Diffraction Data, Newton Square, PA, 1993.
  • 48
    • 0009509312 scopus 로고    scopus 로고
    • Park Scientific Instruments, Sunnyvale, CA
    • 48 User's Guide to Autoprobe CP and LS, Park Scientific Instruments, Sunnyvale, CA, 1996.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.