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Volumn 20, Issue 7, 1999, Pages 707-719

A stochastic optimization approach for roundness measurements

Author keywords

Measurement; Pattern search; Roundness error; Simulated annealing

Indexed keywords

PATTERN RECOGNITION;

EID: 0032697738     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(99)00035-5     Document Type: Article
Times cited : (37)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.