Novel analog-digital flash converter architecture based on capacitive threshold gates

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 2, Issue , 1999, Pages

  Schmid, A ^a   Bowler, D ^a   Baumgartner, R ^a   Leblebici, Y ^a  

^a WORCESTER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DIGITAL SIGNAL PROCESSING; ELECTRIC NETWORK TOPOLOGY; INTEGRATED CIRCUIT TESTING; LOGIC GATES;

ANALOG DIGITAL FLASH CONVERTER; CMOS TECHNOLOGY; THRESHOLD GATES; TRANSIENT RESPONSE TIMES;

ANALOG TO DIGITAL CONVERSION;

EID: 0032692643     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (4)