Spectroscopic characterization of the surface nanostructure of Ti during deposition on polycrystalline aluminum

Surface and Interface Analysis

Volumn 27, Issue 9, 1999, Pages 871-879

  Palacio, C ^a   Arranz, A ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; AUGER ELECTRON SPECTROSCOPY; INTERMETALLICS; NANOSTRUCTURED MATERIALS; POLYCRYSTALLINE MATERIALS; SURFACE STRUCTURE; TITANIUM; TITANIUM ALLOYS; X RAY PHOTOELECTRON SPECTROSCOPY;

FACTOR ANALYSIS; ION SCATTERING SPECTROSCOPY (ISS);

INTERFACES (MATERIALS);

EID: 0032691184     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199909)27:9<871::AID-SIA654>3.0.CO;2-U     Document Type: Article

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