Scanning force microscope cantilever for voltage sampling with ultrafast time resolution

Electronics Letters

Volumn 35, Issue 13, 1999, Pages 1106-1108

  Steffens, W M ^a   Oesterschulze, E ^a  

^a UNIVERSITY OF KASSEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; ELECTRIC POTENTIAL; MICROSCOPES; OPTICAL RESOLVING POWER; OPTICAL SWITCHES; OPTICAL WAVEGUIDES; PHOTOCONDUCTING MATERIALS; SEMICONDUCTING GALLIUM ARSENIDE; ULTRAFAST PHENOMENA;

SCANNING FORCE MICROSCOPY (SFM);

OPTOELECTRONIC DEVICES;

EID: 0032690969     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19990720     Document Type: Article

References (4)

1. WEISS, S., OGELTREE, D.F., BOTKIN, D., SALMERON, M., and CHEMALA, D.S.: 'Ultrafast scanning probe microscopy', Appl. Phys. Lett., 1993, 63, pp. 2567-2569
2. BOTKIN, D., GLASS, J., CHEMALA, D.S., OGELTREE, D.F., SALMERON, M., and WEISS, S.: 'Advances in ultrafast scanning tunneling microscopy', Appl. Phys. Lett., 1996, 69, pp. 1321-1323
3. KEIL, U.D., JENSEN, J.R., and HVAM, J.M.: 'Fiber coupled ultrafast tunneling microscope', J. Appl. Phys., 1997, 81, pp. 2929-2934
4. STEFFENS, W.M., HEISIG, S., KEIL, U.D., and OESTERSCHULZE, E.: 'Cantilever probes for spatio-temporal imaging of voltage pulses with an ultrafast scanning probe microscope', to be published in Appl. Phys. B, March 1999