Interest of X-ray imaging for the study of defects in real quasicrystals

Journal of Physics D: Applied Physics

Volumn 32, Issue 10 A, 1999, Pages

  Gastaldi, J ^a   Mancini, L ^a,b   Reinier, E ^a   Cloetens, P ^b,c   Ludwig, W ^b   Janot, C ^d,e   Baruchel, J ^b   Hartwig J ^b   Schlenker, M ^e  

^a CAMPUS DE LUMINY   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c UNIVERSITY OF ANTWERP   (Belgium)

^d SAPIENZA UNIVERSITY OF ROME   (Italy)

^e LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; IMAGING TECHNIQUES; MATHEMATICAL MODELS; QUASICRYSTALS; SYNCHROTRON RADIATION; X RAY CRYSTALLOGRAPHY;

X RAY IMAGING; X RAY TOPOGRAPHY;

CRYSTAL DEFECTS;

EID: 0032690956     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/10A/331     Document Type: Article

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