Imaging-eclipsing-Z-scan method for measurement of the nonlinear refractive index of materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3572, Issue , 1999, Pages 236-239

  Mohebi, Mehrdad ^a   Jamasbi, Nooshin ^a   Morales, Omar ^a   Garduno, Jesus ^a   Said, A A ^a   Van Stryland, E W ^a  

^a CENTRO DE INVESTIGACIÓN CIENTÍFICA Y DE EDUCACIÓN SUPERIOR DE ENSENADA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; NONLINEAR OPTICS; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX;

IMAGING-ECLIPSING-Z-SCAN METHOD;

OPTICAL MATERIALS;

EID: 0032690133     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)