Phase mask for high focal depth

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3749, Issue , 1999, Pages 14-

  Ojeda Castaneda, J ^a   Castro, Albertina ^a   Santamaria, J ^a  

^a UNIVERSIDAD DE LAS AMÉRICAS PUEBLA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR CORRECTION; FOCUSING; IMAGE ENHANCEMENT; IMAGE QUALITY; OPTICAL RESOLVING POWER; OPTICAL TRANSFER FUNCTION;

DEFOCUS IMAGERY; FOCAL DEPTH; PHASE MASKS;

IMAGING SYSTEMS;

EID: 0032689851     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (2)